Symposium onAdvances in Gem & Diamond DetectionTechnology-2019 (AGDDT-2019)

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August 07 2019 in BDB

Day 1 was dedicated for exchanging current information on scientific and technological developments in gems and diamonds in the form of invited by internationally renowned experts.

The symposium was inaugurated by three stalwarts in the trade, Shri Bakul R. Mehta, Chairman, GII, Shri P.A Agarwal, Chairman, GJEPC and Shri Anoop Mehta, President, BDB.
From left Shri/s Manish Jivani, Anup Zaveri, Bakul R Mehta, Pramod Agarwal, Rajendra A. Shah, Anoop Mehta, Arvind Parikh, Sanjay Kothari and Mahesh Vaghani
Dr. MD Sastry
Dr. MD Sastry
Dr. MD Sastry
Thaong Leelawatanasuk
Ann Van Spaendonk
Mahesh Gaonkar
Wen Xing Xu
Wuyi Wang
Wuyi Wang
Tom Moses

Symposium on Advances in Gem & Diamond Detection
Technology-2019 (AGDDT-2019)

Day 2 was dedicated for three panel discussions on trade related issues, OA/QC & Lab standardization and, current state of art of detection and certification methods and methodologies, with experts as panel members..

Day 2 was dedicated for three panel discussions on trade related issues, OA/QC & Lab standardization and, current state of art of detection and certification methods and methodologies, with experts as panel members..
Welcome Speech by Shri Bakul R. Mehta
The symposium was inaugurated by Shri Bakul R. Mehta, Shri Sanjay shah, Mr.G.Cavaleiri and Shri Mehul Shah.
The symposium was inaugurated by Shri Bakul R. Mehta, Shri Sanjay shah, Mr.G.Cavaleiri and Shri Mehul Shah.
From Left Shri/s Pranay Narvekar, Neel Pethe, Sabyasachi Ray, Suresh Shah , Ramazan Alak Mete and Shreyance Shah.
From Left Shri/s AVR Reddy, Natasha Coutinho, G. Cavaleiri, Ramazan Alak Mete, Nirupa Bhatt and Sumed Prasongpongchai.
From Left Shri/s MD Sastry, Ann Van Spaendonk, Taijin lu, Thanong Leelawatanasuk and WWenxing Xu.
Vote of Thanks by Shri Anup Zaveri.

AGDDT Symposium

Asian Gem and Jewlery institutes form an umbrella Association AGA

GII, Mumbai and NGTC, Beijing have taken their bilateral collaborative efforts to next higher level by forming “Asia – Pacific Gemstone and Technology Standardisation Alliance” (AGA) along with GIT, Thailand and CGE, Shanghai. This historic development culminated into signing a Joint statement on 28.02.2019 during HK International Jewellery Show

Wan Chai, Hong Kong, March 01, 2019: National Gem Testing Center (NGTC) organized a half-day seminar FORUM Win‐Win Meeting on 28‐02‐2019 during the ongoing Hong Kong International Jewellery Show in Wanchai, Hong Kong. CIBJO, GIT, GII, CGL, DFHK, GHK and HKIG were co‐organisers. In this half-day open Forum meeting Win‐Win, Shri Bakul R Mehta, Chairman, GII delivered an invited talk on Current Challenges of International Jewelry Trade and Way Forward. After explaining the current concerns of the market with the inevitable entry of synthetic diamonds and colored gemstones, he emphasized the need for harmonized protocols and standardization of testing laboratories to provide the consumer with reliable results which will enhance the confidence of the consumer for investment in Jewellery. Dr. M.D. Sastry, as a panelist explained various aspects of determining the color origin and need for using instrumental detection methods to differentiate natural diamonds from stimulants. Five other invited speakers from different institutes presented their views related to trade concerns, challenges, barriers, need for standards and, the importance of QA/QC particularly harmonization of protocols and standardization of laboratories. After the meeting, Joint Statement for Establishing the AGA was signed by QA/QC personnel of NGTC, GII, GIT, and CGE in the august presence of Directors or chairmen of all the four institutes.

Dr. A.V.R. Reddy signed the Joint Statement on behalf of GII. The signing of the joint statement is the culmination of a series of bilateral meetings, since 2017, between GII, a project of GJEPC, Mumbai and National Gem Testing Center (NGTC), China. The text of the draft statement was prepared by NGTC and GII gave its inputs during a Dinner meeting the held on 27 February 2019 in which members from GIT, Thailand, and CGE, China participated. In the sidelines of this meeting, a bilateral meeting between Gemological Institute of India (GII), Mumbai and National Gem Testing Center (NGTC), China was organized on 28 February 2019 during 11‐12 AM in the GJEPC booth, HK Convention center, Wan Chai. In this meeting under the leadership of Mr. Bakul Mehta, GII and Mr. Liang Zhenjie, NGTC, progress made so far were reviewed. Discussions centered around the exchange of technical expertise, planning an exchange of teachers and identifying areas that need urgent attention like technical cooperation for Developing and Promoting harmonized methods, methodologies and standards. Mr. Mehta emphasized the need for evolving of joint certification by NGTC, Mumbai and GII, Mumbai for which NGTC agreed to work on. Shri Gagan Choudary and Dr. A V R Reddy presented to Mr. Zhen Jie and Dr. Lixin of NGTC draft copies of “Guidelines for the operation of Gems and Jewlery Testing Laboratories” prepared under the guidance of GJEPC. Meeting logistics were made efficiently by Ms. Naheed Sunke.

Shri Bakul R Mehta delivering an invited talk in the forum Win‐Win
Dr. M.D Sastry, GII participating in a panel discussion of Forum Win‐Win
Display of signed Joint statement.
Dr. A.V.R. Reddy and representatives of GIT, NGTC, and CGE signing the Joint Agreement in the august presence of authorities and senior colleagues of the four institutes.
Shri Bakul R Mehta reviewing the progress made during the bilateral meeting between NGTC and GII
Photograph of Members of NGTC and GII after the bilateral the meeting, taken in front of GJEPC booth.

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